Facilities enabling fabrication and assembly of advanced semiconductor packages under controlled and repeatable conditions, providing realistic test vehicles for reliability-driven research.
Wafer thinning and precise singulation processes for advanced packaging structures. These processes directly influence residual stress, warpage, and crack initiation behavior.
High-precision die attach system enabling multi-chip and heterogeneous integration under controlled bonding conditions.
Electrical interconnection equipment used to study wire deformation, fatigue, and interfacial reliability in packaged devices.